Volume 6 Number 2 (Apr. 2014)
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IJCEE 2014 Vol.6 (2): 172-175 ISSN: 1793-8163
DOI: 10.7763/IJCEE.2014.V6.816

Robust Cephalometric Landmark Identification on Cephalometric Downs Analysis

Ika Purwanti Ningrum, Agus Harjoko, and Munakhir Mudjosemedi
Abstract—Cephalometric landmark identification on cephalometric analysis Downs has been developed. Here we identify a 10 point landmarks used in cephalometric Downs analysis: Gnation, Gonion, Menton, Nation, Orbital, Porion, Point A, Point B, Pogonion, and Sella. The research was conducted in three phases: preprocessing, feature extraction and identification. In the preprocessing phase, the things we do are: image size normalization, Enhance contrast, and took the ROI for each landmark. We use of PPED algorithms for image feature extraction and to measure the similarity between the template vector and vector test, euclidean distance gives good results, despite the large number of image samples do not always give the results was always good. To improve systems performance, we use a multithreading technique. The experimental results showed that the methods used can work well although still found deficiencies and inaccuracies. Accuracy of projections mainly on bilateral landmarks greatly affect the outcome of the identification.

Index Terms—Cephalometrics landmark, cephalometric downs analysis, PPED algorithm.

Ika Purwanti Ningrum is with the Department of Informatic Engineering, Halu Oleo University, South East Sulawesi, Indonesia (e-mail: ika.purwanti.n@gmail.com).
Agus Harjoko is with the Department of Computer Science, Gadjah Mada University, Yogyakarta, Indonesia (e-mail: aharjoko@ugm. ac.id).
Munakhir Mudjosemedi was with the Department of Dentistry, Gadjah Mada University, Yogyakarta, Indonesia (e-mail: munakhirms@yahoo.com).

Cite:Ika Purwanti Ningrum, Agus Harjoko, and Munakhir Mudjosemedi, "Robust Cephalometric Landmark Identification on Cephalometric Downs Analysis," International Journal of Computer and Electrical Engineering vol. 6, no.2, pp. 172-175, 2014.

General Information

ISSN: 1793-8163 (Print)
Abbreviated Title: Int. J. Comput. Electr. Eng.
Frequency: Quarterly
Editor-in-Chief: Prof. Yucong Duan
Abstracting/ Indexing: INSPEC, Ulrich's Periodicals Directory, Google Scholar, EBSCO, ProQuest, and Electronic Journals Library
E-mail: ijcee@iap.org

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