Volume 5 Number 1 (Feb. 2013)
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IJCEE 2013 Vol.5(1): 115-119 ISSN: 1793-8163
DOI: 10.7763/IJCEE.2013.V5.676

Voltage Dips Test System According to IEC 61000-4-11

J. M. Flores-Arias, F. Domingo-Perez, A. Moreno-Munoz, J. J. G. De La Rosa, and V. Pallares

Abstract—Voltage dips analysis is a complex stochastic issue, since it involves a large variety of random factors, such as: type of short-circuits in the power system, location of faults, protective system performance and atmospheric discharges. Among all categories of electrical disturbances, the voltage dips (sags) and momentary interruptions are the nemeses of the automated industrial process. This paper describes a system for voltage dips testing according to IEC 61000-4-11 norm. The system equipment is described also with the test process. Results are represented in power acceptability curves such as the Computer Business Equipment Manufacturing Association (CBEMA) curve and the Information Technology Industry Council (ITIC) curve.

Index Terms—Power acceptability curves, power quality, voltage dip or sag, voltage dips test.

J. M. Flores-Arias, F. Domingo-Perez, A. Moreno, and V. Pallares are with the Comp. Arch., Electronics and Electronic Technology Department,University of Cordoba, Cordoba, ES-14017 Spain (e-mail: jmflores@ uco.es;p62dopef@ uco.es; amoreno@uco.es; el1palov@uco.es).
J. J. G. De La Rosa is with the I.S.A., T.E. y E. Department, University ofCadiz, Algeciras (Cadiz), ES-11202 Spain (e-mail:juanjose.delarosa@uca.es).

Cite: J. M. Flores-Arias, F. Domingo-Perez, A. Moreno-Munoz, J. J. G. De La Rosa, and V. Pallares, "Voltage Dips Test System According to IEC 61000-4-11," International Journal of Computer and Electrical Engineering vol. 5, no. 1, pp. 115-119, 2013.

General Information

ISSN: 1793-8163 (Print)
Abbreviated Title: Int. J. Comput. Electr. Eng.
Frequency: Quarterly
Editor-in-Chief: Prof. Yucong Duan
Abstracting/ Indexing: EI (INSPEC, IET), Ulrich's Periodicals Directory, Google Scholar, EBSCO, ProQuest, and Electronic Journals Library
E-mail: ijcee@iap.org

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