Volume 4 Number 1 (Feb. 2012)
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IJCEE 2012 Vol.4(1): 92-98 ISSN: 1793-8163
DOI: 10.7763/IJCEE.2012.V4.457

Investigation of the Risk of Electromagnetic Security on Computer Systems

Changlin Zhou, Qun Yu, and Litao Wang

Abstract—Electromagnetic environmental effects (E3) and compromising emanations (CE) are two centrally important aspects of computer closely related to electromagnetic security. This paper investigates the electromagnetic compatibility (EMC) for functional safety and emission security on computer systems. Initially, the EMC security issues for the electromagnetic emission of computer systems as well as the susceptibility of tremendously increased critical circuits are presented. Then, impact of electromagnetic security in ubiquitous applications based on computer technology is discussed, which encompasses the damage of E3 and risk potential, CE security limits and experiment example of TEMPEST. Finally, the protection means of computer electromagnetic security are provided. The paper states the need for the guidelines on controlling EMC and the process of CE to achieve electromagnetic security of computer systems.

Index Terms—Electromagnetic compatibility (EMC), electromagnetic environmental effects (E3), compromising emanations (CE), functional safety, emission security, computer

C. l. Zhou is with Zhengzhou Information Engineering University, Zhengzhou, 450001, P.R. China (e-mail: zcl31233@tom.com).
Q. Yu and L. T. Wang are a Ph.D candidate at Zhengzhou Information Science and Technology Institute, Zheng zhou, P.R. China (e-mail:fishes2009@126.com; e-mail: tor.3769@163.com).

Cite: Changlin Zhou, Member, IACSIT, IEEE, Qun Yu, and Litao Wang, "Investigation of the Risk of Electromagnetic Security on Computer Systems," International Journal of Computer and Electrical Engineering vol. 4, no. 1, pp. 92-98, 2012.

General Information

ISSN: 1793-8163 (Print)
Abbreviated Title: Int. J. Comput. Electr. Eng.
Frequency: Quarterly
Editor-in-Chief: Prof. Yucong Duan
Abstracting/ Indexing: EI (INSPEC, IET), Ulrich's Periodicals Directory, Google Scholar, EBSCO, ProQuest, and Electronic Journals Library
E-mail: ijcee@iap.org

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