Volume 3 Number 2 (Apr. 2011)
Home > Archive > 2011 > Volume 3 Number 2 (Apr. 2011) >
IJCEE 2011 Vol.3(2): 271-276 ISSN: 1793-8163 DOI: 10.7763/IJCEE.2011.V3.326

Edge Detection Based on Extrinsic Evolvable Hardware

M. Hosseini and S. Mirzakuchaki

Abstract—Edge detection, the process of locating the edge of an image, is a basic and important subject in computer vision and image processing. There are different techniques for detecting the edges of images among which the evolvable hardware has drawn the attention of researchers for the case in the recent years. This paper is to describe the application of Evolvable Hardware (EHW) to detect the edges based on Sobel operator, the primary edge detection method. In this regard,the smoothing filter is applied to the images which are contaminated by Gaussian noise with the mean of 0 and different variance levels. Evolutionary design of edge detector performs Evolution of spatial masks and threshold. EHW filteris used to conduct the purpose of this paper and the relevant obtained results are compared with the ones gained using only Sobel operator which has constant threshold and spatial masks. According to the results, the edge detection is improved because of using EHW filter.

Index Terms—Edge detection, Evolvable hardware, Genetic algorithm, Sobel operator.

Maryam Hosseini is with the Department of Electrical Engineering, Iran University of Science and Technology, Tehran, Iran.(maryam.hosseini79@gmail.com)
Sattar Mirzakuchaki is with the Department of Electrical Engineering,Iran University of Science and Technology, Tehran, Iran.(m_kuchaki@iust.ac.ir)

Cite: M. Hosseini and S. Mirzakuchaki, "Edge Detection Based on Extrinsic Evolvable Hardware," International Journal of Computer and Electrical Engineering vol. 3, no. 2, pp. 271-276, 2011.

General Information

ISSN: 1793-8163 (Print)
Abbreviated Title: Int. J. Comput. Electr. Eng.
Frequency: Quarterly
Editor-in-Chief: Prof. Yucong Duan
Abstracting/ Indexing: EI (INSPEC, IET), Ulrich's Periodicals Directory, Google Scholar, EBSCO, ProQuest, and Electronic Journals Library
E-mail: ijcee@iap.org

What's New

  • Jun 03, 2019 News!

    IJCEE Vol. 9, No. 2 - Vol. 10, No. 2 have been indexed by EI (Inspec) Inspec, created by the Institution of Engineering and Tech.!   [Click]

  • May 13, 2020 News!

    IJCEE Vol 12, No 2 is available online now   [Click]

  • Mar 04, 2020 News!

    IJCEE Vol 12, No 1 is available online now   [Click]

  • Dec 11, 2019 News!

    The dois of published papers in Vol 11, No 4 have been validated by Crossref

  • Oct 11, 2019 News!

    IJCEE Vol 11, No 4 is available online now   [Click]

  • Read more>>