Volume 2 Number 5 (Oct. 2010)
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IJCEE 2010 Vol.2 (5): 943-947 ISSN: 1793-8163
DOI: 10.7763/IJCEE.2010.V2.256

Functional Test Generation for Guided Control System

Furat Abdul Rassul, Mohammed A. Abdulsada, and Fathi R. Abusief

Abstract—The main objective of this paper is to define and analyze the functional faults for the guided missile control system. The test generations approaches and techniques of functional testing are presented. The test generation is carried out systematically for the system under test by deriving a comprehensive fault model. Based on the number of faults that can be detected, the fault coverage and the test efficiency are computed. The proposed functional testing can detect (26) faults from (39) functional faults which gives an overall efficiency of 66.66%.

Index Terms—Functional testing, Test generation,Functional faults, Guided system, Fault coverage.


Cite: Furat Abdul Rassul, Mohammed A. Abdulsada and Fathi R. Abusief, "Functional Test Generation for Guided Control System," International Journal of Computer and Electrical Engineering vol. 2, no. 5, pp. 943-947, 2010.

General Information

ISSN: 1793-8163 (Print)
Abbreviated Title: Int. J. Comput. Electr. Eng.
Frequency: Quarterly
Editor-in-Chief: Prof. Yucong Duan
Abstracting/ Indexing: EI (INSPEC, IET), Ulrich's Periodicals Directory, Google Scholar, EBSCO, ProQuest, and Electronic Journals Library
E-mail: ijcee@iap.org

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